Patent · US Active

Method and device for measuring and optimizing an optoelectronic component

US10132855B2 · kind B2 · utility

0Cited by

6References

16Claims

0Family size

Assignee

OSRAM Opto Semiconductors GmbH · DE

Inventors

Robert Schulz · Grayling, US
Anton Vogl · Sinzing, DE
Raimund Oberschmid · Sinzing, DE
Roland Zeisel · Tegernheim, DE
Michael Dietz · Treysa, DE

Key dates

Filing date	Mar 6, 2014
Grant date	Nov 20, 2018
Priority date	—
Expiry date	Oct 12, 2034

Classification

Technology area (CPC G)Physics
CPC primaryG01N2201/061
WIPO fieldElectrical machinery, apparatus, energy
WIPO sectorElectrical engineering

Abstract

A method can be used for measuring at least one optoelectronic component arranged on a connection carrier. The method includes exciting an electromagnetic oscillating circuit, which is formed by the optoelectronic component and the connection carrier, thus exciting the optoelectronic component in such a way that the optoelectronic component emits electromagnetic radiation, and measuring at least one electro-optical property of the optoelectronic component.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.