Roland Zeisel
15Patents
1h-index
31Co-inventors
50Inventor score
Filing activity: Apr 21, 2005 → May 23, 2023
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10288671B2 | Method and device for inspecting an optoelectronic component arranged on a connection board | Physics | 3 | Active |
| US10566210B2 | Method for structuring a nitride layer, structured dielectric layer, optoelectronic component, etching method for etching layers, and an environment sensor | Electricity | 0 | Active |
| US12405101B2 | Hybrid wire localization length measurement device | Physics | 0 | Active |
| US11796567B2 | Method and device for electrically contacting components in a semiconductor wafer | Physics | 0 | Active |
| US11378590B2 | Device and method for processing a multiplicity of semiconductor chips | Physics | 0 | Active |
| US10132855B2 | Method and device for measuring and optimizing an optoelectronic component | Physics | 0 | Active |
| US11011573B2 | Radiation-emitting component | Electricity | 0 | Active |
| US10651342B2 | Optoelectronic semiconductor chip | Electricity | 0 | Active |
| US10867873B2 | Method and device for measurement of a plurality of semiconductor chips in a wafer array | Physics | 0 | Active |
| US12356762B2 | Optoelectronic component and method for producing an optoelectronic component | Electricity | 0 | Active |
| US9853018B2 | Optoelectronic semiconductor chip and optoelectronic component | Electricity | 0 | Active |
| US10872783B2 | Method for structuring a nitride layer, structured dielectric layer, optoelectronic component, etching method for etching layers, and an environment sensor | Electricity | 0 | Active |
| US7741227B2 | Process for structuring at least one year as well as electrical component with structures from the layer | Electricity | 0 | Expired |
| US12426408B2 | Optoelectronic semiconductor component | Electricity | 0 | Active |
| US10580938B2 | Light-emitting diode chip, and method for manufacturing a light-emitting diode chip | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.