Reliability-assisted bit-flipping decoding algorithm
US10135464B2 · kind B2 · utility
5Cited by
3References
14Claims
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Key dates
| Filing date | Jan 5, 2016 |
| Grant date | Nov 20, 2018 |
| Priority date | — |
| Expiry date | Sep 12, 2036 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03M13/2963
- WIPO fieldBasic communication processes
- WIPO sectorElectrical engineering
Abstract
A method for decoding low-density parity check (LDPC) codes, includes computing an initial syndrome of an initial output, obtaining an initial number of unsatisfied checks based on the computed initial syndrome, and when the initial number of unsatisfied checks is greater than zero, computing a reliability value with a parity check, performing a bit flip operation, computing a subsequent syndrome of a subsequent output, and ending decoding when a number of unsatisfied checks obtained based on the computed subsequent syndrome is equal to zero.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.