Semiconductor device
US10141070B2 · kind B2 · utility
0Cited by
3References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Aug 7, 2017 |
| Grant date | Nov 27, 2018 |
| Priority date | — |
| Expiry date | Aug 7, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C2029/1204
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A semiconductor device may be provided. The semiconductor device may include sense-amplifier test device. The sense-amplifier test device may include a drive signal generator configured to generate a test voltage applying signal for supplying a ground voltage to a pull-up power-supply line of a sense-amplifier. The sense-amplifier test device may include a sense-amplifier driver configured to supply a ground voltage to the pull-up power-supply line of the sense-amplifier, based on the test voltage applying signal.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.