Increasing the resolution of on-chip measurement circuits
US10145892B2 · kind B2 · utility
1Cited by
7References
16Claims
0Family size
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Key dates
| Filing date | Aug 22, 2016 |
| Grant date | Dec 4, 2018 |
| Priority date | — |
| Expiry date | Aug 22, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2884
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for increasing a resolution of an on-chip measurement circuit is provided. The method includes propagating a first signal through the on-chip measurement circuit to generate a first output. The method also includes propagating a second signal through the on-chip measurement circuit to generate a second output. The second signal includes a delay. The method also includes reconciling the first output and the second output to determine the resolution of the on-chip measurement circuit. The resolution of the on-chip measurement circuit increases in correspondence with a fineness of a step of the delay.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.