Patent · US Active

Polishing liquid for CMP, and polishing method

US10155886B2 · kind B2 · utility

1Cited by
1References
11Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 28, 2014
Grant dateDec 18, 2018
Priority date
Expiry dateApr 7, 2035

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/76229
  • WIPO fieldBasic materials chemistry
  • WIPO sectorChemistry

Abstract

A polishing liquid for CMP, comprising: an abrasive grain including a cerium-based compound; a 4-pyrone-based compound; a polymer compound having an aromatic ring and a polyoxyalkylene chain; a cationic polymer; and water.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.