Patent · US Active

Microscope and microscopy techniques

US10156710B2 · kind B2 · utility

1Cited by
5References
33Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 3, 2011
Grant dateDec 18, 2018
Priority date
Expiry dateOct 3, 2031

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG02F1/116
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

A microscope with at least one illumination beam that is phase modulated in a section along its cross-section with a modulation frequency and a microscope lens for focusing the illumination beam into a test as well as a detection beam path and at least one means of demodulation, wherein at least one polarization altering item is scheduled in the illuminating beam path, for which a phase plate is subordinated that exhibits at least two areas with different phase influence.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.