Microscope and microscopy techniques
US10156710B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 3, 2011 |
| Grant date | Dec 18, 2018 |
| Priority date | — |
| Expiry date | Oct 3, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02F1/116
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
A microscope with at least one illumination beam that is phase modulated in a section along its cross-section with a modulation frequency and a microscope lens for focusing the illumination beam into a test as well as a detection beam path and at least one means of demodulation, wherein at least one polarization altering item is scheduled in the illuminating beam path, for which a phase plate is subordinated that exhibits at least two areas with different phase influence.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.