Carl Zeiss Microscopy GmbH
🏢 View company profile →698Patents
695Active
698Granted
64Portfolio score
Filing activity: Nov 20, 2003 → Dec 17, 2024 · 62 expiring within 5 years
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9201011B2 | Increased depth-resolution microscopy | Physics | 41 | Active |
| US8499537B2 | Arrangement for filling a container with bulk material | Human Necessities | 34 | Active |
| US9536702B2 | Multi-beam particle microscope and method for operating same | Electricity | 29 | Active |
| US9263233B2 | Charged particle multi-beam inspection system and method of operating the same | Electricity | 28 | Active |
| US9336981B2 | Charged particle detection system and multi-beamlet inspection system | Electricity | 27 | Active |
| US10535494B2 | Particle beam system and method for the particle-optical examination of an object | Electricity | 26 | Active |
| US9349571B2 | Particle optical system | Electricity | 25 | Active |
| US10600613B2 | Particle beam system | Electricity | 25 | Active |
| US9336982B2 | Method of detecting electrons, an electron-detector and an inspection system | Electricity | 25 | Active |
| USD771169S1 | Microscope | General | 24 | Active |
| US9653254B2 | Particle-optical systems and arrangements and particle-optical components for such systems and arrangements | Electricity | 24 | Active |
| US9991089B2 | Particle beam system and method for operating a particle optical unit | Electricity | 23 | Active |
| US10622184B2 | Objective lens arrangement usable in particle-optical systems | Electricity | 22 | Active |
| US9702983B2 | Multi-spot collection optics | Electricity | 22 | Active |
| US10388487B2 | Method for operating a multi-beam particle microscope | Electricity | 22 | Active |
| US10354831B2 | Charged particle inspection method and charged particle system | Electricity | 22 | Active |
| US8598525B2 | Particle beam system | Electricity | 22 | Active |
| US10541112B2 | Charged particle beam system and method of operating the same | Electricity | 22 | Active |
| US9530613B2 | Focusing a charged particle system | Electricity | 22 | Active |
| USD784433S1 | Microscope | General | 19 | Active |
| US8705172B2 | Microscopy method and microscope with enhanced resolution | Physics | 18 | Active |
| US9645378B2 | Microscope and method for SPIM microscopy | Physics | 15 | Active |
| US8704196B2 | Combination microscopy | Physics | 14 | Active |
| USD777118S1 | Combined touchpad, operating knobs and display module for electrical control device | General | 14 | Active |
| US8637834B2 | Particle-optical systems and arrangements and particle-optical components for such systems and arrangements | Electricity | 13 | Active |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.