Patent · US Active

Multi-focal structured illumination microscopy systems and methods

US10156711B2 · kind B2 · utility

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3References
5Claims
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Key dates

Filing dateMar 19, 2018
Grant dateDec 18, 2018
Priority date
Expiry dateMar 19, 2038

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2201/105
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Various embodiments for a multi-focal selective illumination microscopy (SIM) system for generating multi-focal patterns of a sample are disclosed. The multi-focal SIM system performs a focusing, scaling and summing operation on each generated multi-focal pattern in a sequence of multi-focal patterns that completely scan the sample to produce a high resolution composite image.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.