Patent · US Active

Integration of photonic, electronic, and sensor devices with SOI VLSI microprocessor technology

US10168477B2 · kind B2 · utility

0Cited by
12References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 17, 2016
Grant dateJan 1, 2019
Priority date
Expiry dateDec 23, 2036

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2224/92242
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

According to an aspect of the present principles, methods are provided for fabricating an integrated structure. A method includes forming a very large scale integration (VLSI) structure including a semiconductor layer at a top of the VLSI structure. The method further includes mounting the VLSI structure to a support structure. The method additionally includes removing at least a portion of the semiconductor layer from the VLSI structure. The method also includes attaching an upper layer to the top of the VLSI structure. The upper layer is primarily composed of a material that has at least one of a higher resistivity or a higher transparency than the semiconductor layer. The upper layer includes at least one hole for at least one of a photonic device or an electronic device. The method further includes releasing said VLSI structure from the support structure.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.