Robert E. Trzcinski
19Patents
6h-index
20Co-inventors
62Inventor score
Filing activity: May 18, 2006 → Mar 25, 2017
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9029238B2 | Advanced handler wafer bonding and debonding | Electricity | 23 | Active |
| US7518850B2 | High yield, high density on-chip capacitor design | Electricity | 10 | Active |
| US7939910B2 | Structure for symmetrical capacitor | Electricity | 9 | Active |
| US7859825B2 | High yield, high density on-chip capacitor design | Electricity | 8 | Active |
| US8419895B2 | Laser ablation for integrated circuit fabrication | Emerging Cross-Sectional Technologies | 7 | Active |
| US7816197B2 | On-chip adjustment of MIMCAP and VNCAP capacitors | Electricity | 6 | Active |
| US8679280B2 | Laser ablation of adhesive for integrated circuit fabrication | Emerging Cross-Sectional Technologies | 5 | Active |
| US7838384B2 | Structure for symmetrical capacitor | Electricity | 4 | Active |
| US7579644B2 | Adjustable on-chip sub-capacitor design | Electricity | 3 | Active |
| US10168478B2 | Integration of photonic, electronic, and sensor devices with SOI VLSI microprocessor technology | Electricity | 3 | Active |
| US7504705B2 | Striped on-chip inductor | Electricity | 2 | Active |
| US9632251B2 | Integration of photonic, electronic, and sensor devices with SOI VLSI microprocessor technology | Electricity | 2 | Active |
| US8227891B2 | Striped on-chip inductor | Electricity | 1 | Active |
| US9606142B2 | Test probe substrate | Electricity | 0 | Active |
| US9851379B2 | Test probe substrate | Electricity | 0 | Active |
| US8388782B2 | Handler attachment for integrated circuit fabrication | Emerging Cross-Sectional Technologies | 0 | Active |
| US10168477B2 | Integration of photonic, electronic, and sensor devices with SOI VLSI microprocessor technology | Electricity | 0 | Active |
| US8937355B2 | Striped on-chip inductor | Electricity | 0 | Active |
| US9897627B2 | Test probe substrate | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.