Non-destructive online testing for safety critical applications
US10169177B1 · kind B1 · utility
5Cited by
12References
18Claims
0Family size
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Inventors
Key dates
| Filing date | Nov 2, 2017 |
| Grant date | Jan 1, 2019 |
| Priority date | — |
| Expiry date | Nov 2, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F30/333
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Embodiments herein describe a methodology for performing non-destructive LBIST when booting an integrated circuit (IC). In one embodiment, when powered on, the IC begins the boot process (e.g., a POST) which is then paused to perform LBIST. However, instead of corrupting or destroying the boot mode state of the IC, the LBIST is non-destructive. That is, after LBIST is performed, the booting process can be resumed in the same state as when LBIST began.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.