System and method for automated cosmetic inspection of electronic devices
US10169858B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 11, 2014 |
| Grant date | Jan 1, 2019 |
| Priority date | — |
| Expiry date | Aug 5, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30164
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A system, device, and method for inspecting the cosmetic and operational features of electronic devices, including computing and telecommunications devices. The cosmetic inspection system includes an image capture unit for capturing the images of the electronic devices, and a user interface for processing the captured images and providing relevant information to the user of the system. Images of the external components such as external casing materials or touch screens of electronic devices are captured and the cosmetic inspection system uses baseline images to make determinations to identify defective components of the electronic devices. Based on these determinations, the system may conclude which, if any, replacement components of the devices are needed to restore the electronic device. In one embodiment, a user of the system may then be provided with information through a user interface about defective components and options for ordering replacement components.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.