Patent · US Active

Plasma processing method and plasma processing apparatus

US10170284B2 · kind B2 · utility

1Cited by
3References
2Claims
0Family size

Assignees

Inventors

Key dates

Filing dateSep 14, 2016
Grant dateJan 1, 2019
Priority date
Expiry dateSep 14, 2036

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH05H1/4652
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

A plasma processing method according to an aspect includes: preparing a plasma processing apparatus including: a chamber; a lower electrode; an upper electrode; a focus ring surrounding a peripheral edge of the lower electrode; and an annular coil disposed on an upper portion of the upper electrode at a more outer position than the peripheral edge of the lower electrode; placing a substrate on the lower electrode, with a peripheral edge of the substrate surrounded by the focus ring; introducing process gas into the chamber; generating plasma of the process gas by applying high-frequency power across the upper electrode and the lower electrode; and leveling an interface of a plasma sheath on an upper portion of the substrate with that on an upper portion of the focus ring by generating a magnetic field by supplying a current to the annular coil.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.