Sample vessel retention structure for scanning probe microscope
US10175263B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 15, 2016 |
| Grant date | Jan 8, 2019 |
| Priority date | — |
| Expiry date | Jun 15, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01Q30/16
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A sample vessel retention mechanism for an inverted microscope having an optical objective and a scanning probe microscope (SPM) head. The inverted microscope includes a platform for supporting a sample vessel, in which is formed an aperture sized to provide a passage for the objective of the inverted microscope to approach the sample vessel from below. The retention mechanism provides a vacuum region formed in the platform, with the vacuum region being barometrically coupled with a vacuum generator. Establishment of a vacuum in the vacuum region prevents or substantially reduces oscillation of the sample vessel floor in an operating frequency range of the SPM head.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.