Chanmin Su
56Patents
9h-index
38Co-inventors
78Inventor score
Filing activity: Jul 2, 2002 → Sep 13, 2021
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7770231B2 | Fast-scanning SPM and method of operating same | Physics | 69 | Active |
| US7055378B2 | System for wide frequency dynamic nanomechanical analysis | Physics | 51 | Expired |
| US6945099B1 | Torsional resonance mode probe-based instrument and method | Physics | 33 | Expired |
| US8650660B2 | Method and apparatus of using peak force tapping mode to measure physical properties of a sample | Physics | 19 | Active |
| US8646109B2 | Method and apparatus of operating a scanning probe microscope | Electricity | 17 | Active |
| US7617719B2 | Method and apparatus for obtaining material property information of a heterogeneous sample using harmonic resonance imaging | Physics | 17 | Active |
| US7107825B2 | Method and apparatus for the actuation of the cantilever of a probe-based instrument | Emerging Cross-Sectional Technologies | 17 | Expired |
| US8739309B2 | Method and apparatus of operating a scanning probe microscope | Physics | 11 | Active |
| US7155964B2 | Method and apparatus for measuring electrical properties in torsional resonance mode | Physics | 11 | Expired |
| US8322220B2 | Non-destructive wafer-scale sub-surface ultrasonic microscopy employing near field AFM detection | Physics | 9 | Active |
| US7757544B2 | Method and apparatus for measuring electrical properties in torsional resonance mode | Physics | 8 | Active |
| US7748260B2 | Thermal mechanical drive actuator, thermal probe and method of thermally driving a probe | Physics | 8 | Active |
| US7555940B2 | Cantilever free-decay measurement system with coherent averaging | Physics | 6 | Active |
| US8881311B2 | Method and apparatus of physical property measurement using a probe-based nano-localized light source | Physics | 6 | Active |
| US7168301B2 | Method and apparatus of driving torsional resonance mode of a probe-based instrument | Physics | 6 | Expired |
| US7584653B2 | System for wide frequency dynamic nanomechanical analysis | Physics | 6 | Active |
| US8904560B2 | Closed loop controller and method for fast scanning probe microscopy | Physics | 6 | Active |
| US7658097B2 | Method and apparatus of high speed property mapping | Physics | 5 | Active |
| US8997259B2 | Method and apparatus of tuning a scanning probe microscope | Physics | 4 | Active |
| US8756710B2 | Miniaturized cantilever probe for scanning probe microscopy and fabrication thereof | Physics | 4 | Active |
| US9588136B2 | Method and apparatus of operating a scanning probe microscope | Physics | 4 | Active |
| US9575090B2 | Force measurement with real-time baseline determination | Physics | 3 | Active |
| US9322842B2 | Method and apparatus of operating a scanning probe microscope | Physics | 3 | Active |
| US9213047B2 | Method and apparatus of electrical property measurement using an AFM operating in peak force tapping mode | Physics | 3 | Active |
| US10197595B2 | Dual-probe scanning probe microscope | Physics | 3 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.