Burn-in testing of circuits

US10180455B2 · kind B2 · utility

Assignee

• Infineon Technologies AG · DE

Inventors

• Rex Kho · Holzkirchen, DE
• Markus Schuemmer · Holzkirchen, DE
• Human Boluki · Munich, DE

Key dates

• Filing date: May 22, 2017
• Grant date: Jan 15, 2019
• Expiry date: Jul 11, 2037

Classification

• Technology area (CPC G): Physics
• CPC primary: G01R31/30
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

Circuits and methods are provided for a signal path between circuit parts. During normal operation, a delay is deactivated. During a burn-in test, the delay is activated. In the deactivated state, a delay component may be disconnected from a supply voltage.