Multi-spectral x-ray detection apparatus
US10180506B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 16, 2014 |
| Grant date | Jan 15, 2019 |
| Priority date | — |
| Expiry date | May 16, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG21K1/10
- WIPO fieldEnvironmental technology
- WIPO sectorChemistry
Abstract
An x-ray X-ray imaging apparatus includes an x-ray detector (3) that is configured to convert incident x-ray wavelength photons directly into electronic signals, a position for a material under test (2), an x-ray source (1), and a structure (4) configured to perturb an x-ray energy spectrum, each lying on a common axis. The x-ray source (1) is arranged to direct an x-ray energy spectrum along the common axis to impinge upon the member, the structure (4) configured to perturb the x-ray energy spectrum, and positioned material under test (2). The structure (4) lies between the x-ray source (1) and the member to one side of the position for material under test (2) intersecting the common axis, and the structure (4) includes at least three adjacent regions, each region different to immediately adjacent regions and configured to perturb the x-ray energy spectrum differently.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.