Paul Scott
17Patents
5h-index
16Co-inventors
63Inventor score
Filing activity: Jun 22, 1990 → Apr 15, 2024
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5150314A | Metrological apparatus and calibration method therefor | Physics | 85 | Expired |
| US6031928A | Image processing apparatus and method of processing height data to obtain image data using gradient data calculated for a plurality of different points of a surface and adjusted in accordance with a selected angle of illumination | Physics | 61 | Expired |
| US6327788A | Surface form measurement | Physics | 34 | Expired |
| US5926781A | Roundness measuring | Physics | 25 | Expired |
| US6345107B1 | Image processing apparatus and method of processing height data to obtain image data using gradient data calculated for a plurality of different points of a surface and adjusted in accordance with a selected angle of illumination | Physics | 6 | Expired |
| US8635783B2 | Surface measurement instrument and method | Physics | 4 | Active |
| US5478139A | Mobile digging/cutting system | Fixed Constructions | 4 | Expired |
| US10588592B2 | Scatter in x-ray apparatus and methods of their use | Physics | 4 | Active |
| US7668678B2 | Calibration of a Metrological apparatus | Physics | 2 | Active |
| US9322631B2 | Surface measurement instrument and calibration thereof | Physics | 1 | Active |
| US11992356B2 | X-ray imaging system | Physics | 1 | Active |
| US10180506B2 | Multi-spectral x-ray detection apparatus | Physics | 0 | Active |
| US10444000B2 | Surface measurement instrument and method | Physics | 0 | Active |
| US10820878B2 | Apparatus and method for the correction of scatter in a radiographic system | Physics | 0 | Active |
| US11779878B2 | Carbon dioxide capture device and method | Emerging Cross-Sectional Technologies | 0 | Active |
| US12329561B2 | X-ray imaging system | Physics | 0 | Active |
| US12085562B2 | Apparatus | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.