Systems and methods for statistical static timing analysis
US10185795B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 11, 2016 |
| Grant date | Jan 22, 2019 |
| Priority date | — |
| Expiry date | Dec 10, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F2119/12
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Electronic design automation systems, methods, and media are presented for characterizing on-chip variation of circuit elements in a circuit design using statistical values including skew, and for performing statistical static timing analysis using these statistical values. One embodiment models delay characteristics under certain operating conditions for circuit elements with asymmetric (e.g., non-Gaussian) probability density functions using normalized skewness. The modeled delay can then be used to perform various timing analysis operations.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.