Single image detection
US10186026B2 · kind B2 · utility
7Cited by
15References
36Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Nov 16, 2016 |
| Grant date | Jan 22, 2019 |
| Priority date | — |
| Expiry date | Jul 11, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V10/50
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Methods and systems for detecting defects on a specimen are provided. One system includes a generative model. The generative model includes a non-linear network configured for mapping blocks of pixels of an input feature map volume into labels. The labels are indicative of one or more defect-related characteristics of the blocks. The system inputs a single test image into the generative model, which determines features of blocks of pixels in the single test image and determines labels for the blocks based on the mapping. The system detects defects on the specimen based on the determined labels.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.