Inventor · San Jose, CA, US

Kris Bhaskar

30Patents
10h-index
64Co-inventors
74Inventor score

Filing activity: Feb 28, 2005 → Aug 4, 2021

Most-cited inventions

PatentTitleAreaCited byStatus
US8126255B2 Systems and methods for creating persistent data for a wafer and for using persistent data for inspection-related functions Physics 146 Active
US9222895B2 Generalized virtual inspector Physics 78 Active
US9222771B2 Acquisition of information for a construction site Physics 33 Active
US10043261B2 Generating simulated output for a specimen Physics 19 Active
US7796804B2 Methods for generating a standard reference die for use in a die to standard reference die inspection and methods for inspecting a wafer Physics 18 Active
US10346740B2 Systems and methods incorporating a neural network and a forward physical model for semiconductor applications Physics 14 Active
US10360477B2 Accelerating semiconductor-related computations using learning based models Physics 14 Active
US8204296B2 Methods for generating a standard reference die for use in a die to standard reference die inspection and methods for inspecting a wafer Physics 14 Active
US9965901B2 Generating simulated images from design information Physics 12 Active
US10599951B2 Training a neural network for defect detection in low resolution images Physics 11 Active
US8422010B2 Methods and systems for determining a characteristic of a wafer Physics 9 Active
US10395356B2 Generating simulated images from input images for semiconductor applications Physics 9 Active
US8284394B2 Methods and systems for determining a characteristic of a wafer Physics 9 Active
US10181185B2 Image based specimen process control Electricity 9 Active
US9916965B2 Hybrid inspectors Electricity 8 Active
US10186026B2 Single image detection Physics 7 Active
US9262821B2 Inspection recipe setup from reference image variation Physics 7 Active
US9176072B2 Dark field inspection system with ring illumination Physics 6 Active
US9355208B2 Detecting defects on a wafer Physics 4 Active
US7345753B2 Apparatus and methods for analyzing defects on a sample Physics 4 Expired
US11415526B2 Multi-controller inspection system Physics 3 Active
US11551348B2 Learnable defect detection for semiconductor applications Physics 3 Active
US10648924B2 Generating high resolution images from low resolution images for semiconductor applications Physics 3 Active
US11580375B2 Accelerated training of a machine learning based model for semiconductor applications Physics 2 Active
US10713769B2 Active learning for defect classifier training Physics 2 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.