Patent · US Active

Composition for resist patterning and method for forming pattern using same

US10191380B2 · kind B2 · utility

0Cited by
6References
14Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 13, 2015
Grant dateJan 29, 2019
Priority date
Expiry dateOct 13, 2035

Classification

  • Technology area (CPC C)Chemistry; Metallurgy
  • CPC primaryC11D2111/22
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

[Problem]To provide a composition capable of improving surface roughness of resist patterns, and also to provide a pattern formation method employing the composition.[Solution]The present invention provides a composition containing a particular nitrogen-containing compound, an anionic surfactant having a sulfo group, and water; and also provides a pattern formation method containing a step of applying the composition to a resist pattern beforehand developed and dried.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.