Patent · US Active

Nonvolatile memory cell and fabrication method thereof

US10192874B2 · kind B2 · utility

4Cited by
13References
15Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 19, 2017
Grant dateJan 29, 2019
Priority date
Expiry dateJun 19, 2037

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D64/035

Abstract

A nonvolatile memory cell includes a substrate having a drain region, a source region, and a channel region between the drain region and the source region. A floating gate and a select gate are disposed on the channel region. A control gate is disposed on the floating gate. An erase gate is disposed on the source region. The erase gate includes a lower end portion that extends into a major surface of the substrate.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.