Image analysis
US10198662B2 · kind B2 · utility
2Cited by
2References
12Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Nov 14, 2016 |
| Grant date | Feb 5, 2019 |
| Priority date | — |
| Expiry date | Nov 14, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V10/7553
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A computer-implemented method for identifying features in an image. The method comprises fitting a plurality of second models to the image, the plurality of second models together modelling a region of interest, wherein each part of the region of interest is modelled by at least two of the plurality of second models; and identifying the features in the image based upon the fit of the plurality of second models.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.