Apparatuses and methods for sensing a phase-change test cell and determining changes to the test cell resistance due to thermal exposure
US10199097B2 · kind B2 · utility
1Cited by
7References
20Claims
0Family size
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Key dates
| Filing date | Dec 27, 2017 |
| Grant date | Feb 5, 2019 |
| Priority date | — |
| Expiry date | Dec 27, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C2029/5002
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A phase change memory array may include at least one cell used to determine whether the array has been altered by thermal exposure over time. The cell may be the same or different from the other cells. In some embodiments, the cell is only read in response to an event. If, in response to that reading, it is determined that the cell has changed state or resistance, it may deduce whether the change is a result of thermal exposure. Corrective measures may then be taken.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.