Method of sputtering and sputter system
US10202682B2 · kind B2 · utility
11Cited by
4References
24Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Mar 31, 2017 |
| Grant date | Feb 12, 2019 |
| Priority date | — |
| Expiry date | Mar 31, 2037 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J37/3467
- WIPO fieldSurface technology, coating
- WIPO sectorChemistry
Abstract
So as to control the operation of a sputter target during the lifetime of the target and under HIPIMS operation, part of a magnet arrangement associated to the target is retracted from the target whereas a second part II of the magnet arrangement is, if at all, retracted less from the addressed backside during the lifetime of the target. Thereby, part I is closer to the periphery of target than part II, as both are eccentrically rotated about a rotational axis.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.