Patent · US Active

Functionally integrated laser scanning microscope

US10203490B2 · kind B2 · utility

1Cited by

0References

10Claims

0Family size

Assignees

Carl Zeiss Microscopy GmbH · DE
Carl Zeiss AG · DE

Inventors

Daniel Schwedt · Weimar, DE
Matthias Wald · Jena, DE
Tiemo Anhut · Jena, DE

Key dates

Filing date	May 22, 2015
Grant date	Feb 12, 2019
Priority date	—
Expiry date	Oct 16, 2035

Classification

Technology area (CPC G)Physics
CPC primaryG02B21/367
WIPO fieldOptics
WIPO sectorInstruments

Abstract

A functionally integrated laser scanning microscope for scanning a sample with laser illumination, selectably in a confocal, line or wide-field operating mode, comprising a laser light source, an illumination and detection beam path, a detection device and at least one objective, wherein the illumination and detection beam path has optical means for the configuration of the laser illumination, at least one scanner for scanning the sample with the laser illumination, and a beam splitter for separating illumination and detection light, and controllable optical elements for changing the beam guiding depending on the operating mode selected in each case.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.