Systems, methods and computer program products for analyzing performance of semiconductor devices
US10204188B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 8, 2016 |
| Grant date | Feb 12, 2019 |
| Priority date | — |
| Expiry date | May 15, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F2111/08
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A computer implemented method for determining performance of a semiconductor device is provided. The method includes providing a technology computer aided design data set corresponding to nominal performance of the semiconductor device, identifying a plurality of process variation sources that correspond to process variations that occur during the manufacturing of the semiconductor device, generating a nominal value look-up table of electrical parameters of the semiconductor device using nominal values of each of the plurality of process variation sources, and generating a plurality of process variation look-up tables of electrical parameters of the semiconductor device using variation values corresponding to each of the plurality of process variation sources that are identified as corresponding to the semiconductor device.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.