Systems and methods for frequency domain calibration and characterization
US10205456B2 · kind B2 · utility
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3References
4Claims
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Key dates
| Filing date | Feb 24, 2017 |
| Grant date | Feb 12, 2019 |
| Priority date | — |
| Expiry date | Apr 3, 2037 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03L2207/50
- WIPO fieldBasic communication processes
- WIPO sectorElectrical engineering
Abstract
A system for assigning a characterization and calibrating a parameter is disclosed. The system includes a frequency measurement circuit and a finite state machine. The frequency measurement circuit is configured to measure frequencies of an oscillatory signal and to generate a measurement signal including measured frequencies. The finite state machine is configured to control measurements by the frequency measurement circuit, to assign a characterization to a parameter based on the measurement signal, and to generate a calibration signal based on the characterized parameter.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.