Cho-Ying Lu
14Patents
4h-index
22Co-inventors
56Inventor score
Filing activity: Mar 30, 2012 → Nov 14, 2023
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8536899B1 | Calibration circuit apparatus and method | Electricity | 7 | Active |
| US9148153B2 | Systems and methods for frequency domain calibration and characterization | Electricity | 6 | Active |
| US10715165B2 | High-speed analog-to-digital converter | Electricity | 5 | Active |
| US10659072B1 | Time-interleaved analog-to-digital converter with calibration | Electricity | 4 | Active |
| US10367518B2 | Apparatus and method for single temperature subthreshold factor trimming for hybrid thermal sensor | Physics | 1 | Active |
| US10630299B2 | Systems and methods for frequency domain calibration and characterization | Electricity | 0 | Active |
| US10109551B2 | Methods and apparatuses for determining a parameter of a die | Electricity | 0 | Active |
| US9537495B2 | Systems and methods for frequency domain calibration and characterization | Electricity | 0 | Active |
| US10623106B2 | Orthogonal frequency division multiplexing single sideband transmission over a waveguide | Electricity | 0 | Active |
| US11057044B2 | Time-interleaved analog-to-digital converter with calibration | Electricity | 0 | Active |
| US11855145B2 | Semiconductor structure | Electricity | 0 | Active |
| US10340923B2 | Systems and methods for frequency domain calibration and characterization | Electricity | 0 | Active |
| US10205456B2 | Systems and methods for frequency domain calibration and characterization | Electricity | 0 | Active |
| US12356684B2 | Semiconductor structure having asymmetric source/drain regions | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.