Patent · US Active

Integrated RF circuit with phase-noise test capability

US10205541B2 · kind B2 · utility

1Cited by

2References

20Claims

0Family size

Assignee

Infineon Technologies AG · DE

Inventors

Oliver Frank · Hannover, DE
Guenter Haider · Linz, AT
Jochen Schrattenecker · Eisenlohrsweg, AT

Key dates

Filing date	Aug 20, 2018
Grant date	Feb 12, 2019
Priority date	—
Expiry date	Aug 20, 2038

Classification

Technology area (CPC H)Electricity
CPC primaryH04B17/14
WIPO fieldTelecommunications
WIPO sectorElectrical engineering

Abstract

An integrated circuit is described herein. According to one or more embodiments, the integrated circuit includes a local oscillator with a voltage-controlled oscillator (VCO) that generates a local oscillator signal. Further, the integrated circuit includes a frequency divider coupled to the VCO downstream thereof. The frequency divider provides a frequency-divided local oscillator signal by reducing the frequency of the local oscillator signal by a constant factor. A first test pad of the integrated circuit is configured to receive a reference oscillator signal. Further, the integrated circuit includes a first mixer that receives the reference oscillator signal and the frequency-divided local oscillator signal to down-convert the frequency-divided local oscillator signal.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.