Patent · US Active

Lithographic apparatus with a patterning device environment

US10209635B2 · kind B2 · utility

1Cited by
6References
30Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 7, 2015
Grant dateFeb 19, 2019
Priority date
Expiry dateDec 7, 2035

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG03F7/70866
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

A lithographic apparatus injects gas between a patterning device and a patterning device masking blade to help protect the patterning device from contamination. The gas may be injected into the space defined between the patterning device and the patterning device blade by one or more gas supply nozzles that are arranged on at least one side of the patterning device. The one or more gas supply nozzles are coupled to a frame which a patterning device support structure moves relative to. Each nozzle may be constructed and arranged to supply gas over at least the patterning region of the reflective patterning device.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.