Methods for generating reliable responses in physical unclonable functions (PUFs) and methods for designing strong PUFs
US10218517B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 25, 2015 |
| Grant date | Feb 26, 2019 |
| Priority date | — |
| Expiry date | Oct 15, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F21/73
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
In some aspects, a method includes obtaining, by a response generator circuit, reliability information for each bit of an array of bits provided by a physical unclonable function (PUF) circuit; receiving, from the PUF circuit during run time, an array of values for the array of bits; selecting a plurality of values from the array of values received from the PUF circuit in accordance with the reliability information; and generating, by the response generator circuit, a PUF response from the selected plurality of values.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.