Patent · US Active

Method for machining a scale

US10222192B2 · kind B2 · utility

0Cited by
10References
19Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 25, 2017
Grant dateMar 5, 2019
Priority date
Expiry dateAug 28, 2037

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01D11/16
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method for machining a scale of a position-measuring system is provided for such a scale having, on a first surface, a measuring graduation and, on a second surface, is attachable to a carrier body. The first and second surfaces are bounded respectively by first and second edges in a region of a lateral peripheral side edge. The scale is machined to produce a defined outer contour of the scale such that a raised ridge of material is formed at each of the first and second edges. The scale is machined differently at the first edge than at the second edge in such a manner that a dimension of the raised ridge of material at the first edge perpendicular to the first surface is smaller than a dimension of the raised ridge of material at the second edge perpendicular to the second surface.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.