Patent · US Active

Capacitive sensor testing

US10228414B2 · kind B2 · utility

1Cited by

1References

19Claims

0Family size

Assignee

Infineon Technologies AG · DE

Inventors

Cesare Buffa · Villach, AT
Richard Gaggl · Pörtschach am Wörther See, AT

Key dates

Filing date	Mar 23, 2016
Grant date	Mar 12, 2019
Priority date	—
Expiry date	Aug 4, 2036

Classification

Technology area (CPC G)Physics
CPC primaryG01D5/2403
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

Sensor devices and methods are provided where a test signal is applied to a capacitive sensor. Furthermore, a bias voltage is applied to the capacitive sensor via a high impedance component. A path for applying the test signal excludes the high impedance component. Using this testing signal, in some implementations a capacity imbalance of the capacitive sensor may be detected.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.