Device degradation cause estimation method and device
US10234360B2 · kind B2 · utility
0Cited by
2References
10Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jul 30, 2014 |
| Grant date | Mar 19, 2019 |
| Priority date | — |
| Expiry date | Sep 8, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG07C5/08
- WIPO fieldControl
- WIPO sectorInstruments
Abstract
A degradation cause estimation device is provided with a degradation detector for detecting the amount of degradation undergone by a device, a state observation device for detecting observation values for internal portions, values observed from outside, or device control and operation information, a degradation section detector for detecting a section undergoing degradation using the output values of the degradation detector, and a cause estimator for estimating the cause of the degradation using the device state observations for the degradation section, and outputs the cause for the degradation section.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.