Inventor · Tokyo, JP

Shinya Yuda

20Patents
4h-index
37Co-inventors
59Inventor score

Filing activity: Oct 29, 2003 → May 8, 2015

Most-cited inventions

PatentTitleAreaCited byStatus
US8838324B2 Monitoring and diagnosing device for working machine Physics 17 Active
US9678845B2 Abnormality diagnostic system and industrial machinery Physics 5 Active
US9074348B2 Learning diagnostic system, state diagnostic device, and state learning device for working machine Physics 4 Active
US6889107B2 Support system for parts standardization Physics 4 Expired
US7610259B2 Management apparatus, program and method for controlling data included in bill of material Physics 3 Active
US9292011B2 Operating machine and maintenance and inspection information generating apparatus Physics 2 Active
US10620082B2 Method and device displaying material fatigue of machine Physics 2 Active
US8701979B2 Cabling work aiding system and work aiding method Electricity 2 Active
US9122273B2 Failure cause diagnosis system and method Physics 2 Active
US10098215B2 X-ray tube predictive fault indicator sensing device, X-ray tube predictive fault indicator sensing method, and X-ray imaging device Electricity 2 Active
US8271693B2 Cable connection support apparatus and method of supporting cable connection Physics 2 Active
US7409324B2 Design support system Physics 1 Expired
US9810743B2 Deterioration diagnosis system Physics 0 Active
US8395804B2 RFID registration system and method thereof Physics 0 Active
US8065120B2 Support system Physics 0 Active
US10235658B2 Maintenance management device for operating machinery Physics 0 Active
US10204321B2 Device for searching and method for searching for similar breakdown cases Physics 0 Active
US10430733B2 Analysis method for time series data and device therefor Physics 0 Active
US10234360B2 Device degradation cause estimation method and device Physics 0 Active
US9020942B2 Maintenance operation instance collection apparatus, maintenance operation instance collection method, and maintenance operation instance collection program Physics 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.