Patent · US Active

Shape measurement apparatus and shape measurement method

US10247544B2 · kind B2 · utility

0Cited by
4References
7Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 20, 2016
Grant dateApr 2, 2019
Priority date
Expiry dateDec 20, 2036

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01B11/306
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

[Object] To provide a shape measurement apparatus that is capable of measuring the amount of warpage in the width direction of a strip-shaped body with higher sensitivity.[Solution] Provided is a shape measurement apparatus including: a light source configured to irradiate a surface of a moving strip-shaped body with linear light at a prescribed angle of incidence; a screen configured such that reflected light of the linear light on the surface of the strip-shaped body is projected on the screen; an imaging unit configured to image the reflected light of the linear light projected on the screen; and an arithmetic processing unit configured to acquire the amount of warpage in a width direction of the strip-shaped body on the basis of a line length of the reflected light of the linear light imaged by the imaging unit.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.