Inventor · Tokyo, JP

Atsuhiro Hibi

6Patents
2h-index
7Co-inventors
33Inventor score

Filing activity: Apr 22, 2016 → May 19, 2017

Most-cited inventions

PatentTitleAreaCited byStatus
US10605591B2 Shape measurement apparatus and shape measurement method Physics 26 Active
US10281408B2 Inspection object imaging apparatus, inspection object imaging method, surface inspection apparatus, and surface inspection method Physics 3 Active
US10451410B2 Shape measurement apparatus and shape measurement method Physics 2 Active
US10527410B2 Shape measurement apparatus and shape measurement method Physics 0 Active
US10274314B2 Shape inspection method, shape inspection apparatus, and program Physics 0 Active
US10247544B2 Shape measurement apparatus and shape measurement method Physics 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.