Patent · US Active

Resolution enhancement for line scanning excitation microscopy systems and methods

US10247930B2 · kind B2 · utility

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5References
20Claims
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Key dates

Filing dateSep 22, 2015
Grant dateApr 2, 2019
Priority date
Expiry dateOct 10, 2035

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG02B27/58
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

A resolution enhancement technique for a line scanning confocal microscopy system that generates vertical and horizontal line scanning patterns onto a sample is disclosed. The line scanning confocal microscopy system is capable of producing line scanning patterns through the use of two alternative pathways that generate either the vertical line scanning pattern or horizontal line scanning pattern.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.