Use of silyl bridged alkyl compounds for dense OSG films
US10249489B2 · kind B2 · utility
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25Claims
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Key dates
| Filing date | Oct 20, 2017 |
| Grant date | Apr 2, 2019 |
| Priority date | — |
| Expiry date | Oct 20, 2037 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01L21/0262
- WIPO fieldSemiconductors
- WIPO sectorElectrical engineering
Abstract
Low dielectric organosilicon films are deposited by a process comprising the steps of: providing a substrate within a vacuum chamber; introducing into the vacuum chamber a gaseous silicon containing precursor composition comprising at least one organosilicon precursor selected from the group consisting of Formula (I) and Formula (II):
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.