Patent · US Active

Microscope having low distortion aberration

US10254524B2 · kind B2 · utility

2Cited by
3References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 11, 2015
Grant dateApr 9, 2019
Priority date
Expiry dateNov 11, 2035

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG02B27/0068
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

Beam deflection units in light-scanning microscopes are usually arranged in planes that are conjugate to the objective pupil. The scan optics, which is required for generating the conjugate pupil planes, is complicated and not very light efficient. The invention is intended to enable a higher image quality, simpler adjustment and a lower light loss microscope. The optical system comprises a concave mirror (36) for imaging a respective point of the first and second beam deflection units (30A, 30B) onto one another. The concave mirror (36), the first beam deflection unit (30A), and the second beam deflection unit (30B) are arranged such that the illumination beam path is reflected exactly once at the concave mirror (36). A first distortion caused by the concave mirror (36) and a second distortion of the imaging caused by the first and second beam deflection units (30A, 30B) at least partly compensate for one another.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.