Microscope having low distortion aberration
US10254524B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 11, 2015 |
| Grant date | Apr 9, 2019 |
| Priority date | — |
| Expiry date | Nov 11, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02B27/0068
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
Beam deflection units in light-scanning microscopes are usually arranged in planes that are conjugate to the objective pupil. The scan optics, which is required for generating the conjugate pupil planes, is complicated and not very light efficient. The invention is intended to enable a higher image quality, simpler adjustment and a lower light loss microscope. The optical system comprises a concave mirror (36) for imaging a respective point of the first and second beam deflection units (30A, 30B) onto one another. The concave mirror (36), the first beam deflection unit (30A), and the second beam deflection unit (30B) are arranged such that the illumination beam path is reflected exactly once at the concave mirror (36). A first distortion caused by the concave mirror (36) and a second distortion of the imaging caused by the first and second beam deflection units (30A, 30B) at least partly compensate for one another.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.