Patent · US Active

Method of fabricating a FET transistor having a strained channel

US10263077B1 · kind B1 · utility

7Cited by
3References
12Claims
0Family size

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Inventors

Key dates

Filing dateDec 22, 2017
Grant dateApr 16, 2019
Priority date
Expiry dateDec 22, 2037

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D62/822
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

Method for fabricating at least one FET transistor (100a, 100b) comprising:

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.