Patent · US Active

Sample preparation system and preparation method for an electron microscope

US10267713B2 · kind B2 · utility

0Cited by
1References
16Claims
0Family size

Assignee

Inventor

Key dates

Filing dateDec 8, 2016
Grant dateApr 23, 2019
Priority date—
Expiry dateJun 2, 2037

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J2237/204
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A sample preparation system includes a slicing module, a first tank, a sequencing module and a pickup module. The slicing module is utilized to sequentially slice a sample block into a plurality of sample slices. The first tank is utilized to receive the sample slices. The sample slices float on a fluid in the first tank, and the sample slices are moved by the flowing fluid. The sequencing module is disposed at a side of the first tank, so as to separate the sample slices sequentially. The pick module is coupled with the first tank, so as to pick up the sample slices sequentially and place the sample slices on corresponding sample holders. In addition, a sample preparation method is also provided.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.