Materials Analysis Technology Inc.
13Patents
13Active
13Granted
60Portfolio score
Filing activity: Feb 7, 2014 → Jun 16, 2023
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9558565B2 | Dimension calculation method for a semiconductor device | Physics | 3 | Active |
| US10416050B2 | Liquid sample drying apparatus, dried sample test piece and preparation method thereof | Physics | 1 | Active |
| US11291991B2 | Sample carrier device and method for operating the same | Performing Operations; Transporting | 0 | Active |
| US11946945B2 | Sample analyzing method and sample preparing method | Electricity | 0 | Active |
| US10379075B2 | Sample collection device and manufacturing method thereof | Electricity | 0 | Active |
| US11955312B2 | Physical analysis method, sample for physical analysis and preparing method thereof | Electricity | 0 | Active |
| US12154775B2 | Analysis system, auxiliary analysis apparatus and analysis method | Physics | 0 | Active |
| US11959834B2 | Manufacturing method of sample collection component | Electricity | 0 | Active |
| US12260541B2 | Soldering quality inspection method and soldering quality inspection apparatus | Physics | 0 | Active |
| US10309875B2 | Sample collection component and manufacturing method thereof | Electricity | 0 | Active |
| US10267713B2 | Sample preparation system and preparation method for an electron microscope | Electricity | 0 | Active |
| US12361530B2 | Curve alignment method and curve alignment apparatus | Physics | 0 | Active |
| US11282669B2 | Carrier device and carrier kit | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.