X-ray analytical instrument with improved control of detector cooling and bias supply
US10267925B2 · kind B2 · utility
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20Claims
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Key dates
| Filing date | Aug 22, 2018 |
| Grant date | Apr 23, 2019 |
| Priority date | — |
| Expiry date | Aug 22, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2223/3103
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Disclosed is a circuit for controlling the temperature and the bias voltage of a detector used by an X-ray analytical instrument. The circuit uses a single common reference voltage for the temperature measurement and for all the ADCs and DACs in the circuit, resulting in reduced drift and improved reproducibility of detector temperature and bias voltage. ADCs with a larger number of bits are used to produce precision values of the temperature, the bias voltage, and their respective setpoints. The setpoints are digitally varied until the precision setpoint values correspond to desired values of temperature and bias setpoints.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.