Olympus Scientific Solutions Americas Corp.
51Patents
51Active
51Granted
55Portfolio score
Filing activity: Jan 27, 2012 → Mar 11, 2021 · 1 expiring within 5 years
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| USD794207S1 | Casing of a hand held ultrasonic flaw detector instrument | General | 19 | Active |
| US9683950B2 | XRD sample handling apparatus | Physics | 13 | Active |
| US9625424B2 | System and a method of automatically generating a phased array ultrasound scan plan for non-destructive inspection | Physics | 9 | Active |
| USD769447S1 | Casing of a hand held X-ray fluorescence (XRF) analyzer instrument | General | 6 | Active |
| USD769746S1 | Casing for a non-destructive inspection instrument | General | 5 | Active |
| US9759692B2 | System and method of dynamic gating in non-destructive weld inspection | Physics | 3 | Active |
| US9746446B2 | Probe holder providing constant lift-off for in-line bar-pipe testing | Physics | 3 | Active |
| US9625286B2 | Adjustable probe holder assembly for an inspection sensor | Physics | 2 | Active |
| US9081490B2 | Apparatus and method for overlaying touch-screen input with digital display of an NDT/NDI instrument | Physics | 2 | Active |
| USD796680S1 | Docking station for a hand held X-ray fluorescence (XRF) instrument | General | 2 | Active |
| US9952185B1 | Method of calibrating a phased array ultrasonic system without known test object sound speed | Physics | 2 | Active |
| US9683952B2 | Test stand for XRF instrument enabling multi-way operation | Physics | 2 | Active |
| US9063174B2 | Hall effect measurement instrument with temperature compensation | Physics | 1 | Active |
| US9952183B2 | Focusing wedge for ultrasonic testing | Physics | 1 | Active |
| US10979336B2 | Method and apparatus for communication of data between NDT/NDI instrument and an external network | Electricity | 1 | Active |
| US10564131B2 | Water wedge for flexible probe | Physics | 1 | Active |
| US10309934B2 | Method and system of deducing sound velocity using time-of-flight of surface wave | Physics | 1 | Active |
| US9372164B2 | XRF instrument with removably attached window protecting films | Physics | 1 | Active |
| US9007053B2 | Circuitry for and a method of compensating drift in resistance in eddy current probes | Physics | 1 | Active |
| US11442042B2 | Flexible ceramic coil circuit for high temperature non-destructive inspection | Electricity | 1 | Active |
| US9746432B2 | Spacer accessory for XRF handheld analyzers | Physics | 1 | Active |
| US10094936B2 | X-ray analytical instrument with improved control of detector cooling and bias supply | Physics | 1 | Active |
| US9964526B2 | Phased-array probe and a phased-array search unit | Physics | 1 | Active |
| US9933375B2 | XRF/XRD system with dynamic management of multiple data processing units | Physics | 1 | Active |
| US10684258B2 | Eddy current inspection instrument with noise shaping filter | Electricity | 1 | Active |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.