Patent · US Active

Integrated structure of MEMS microphone and pressure sensor and manufacturing method for the integrated structure

US10273150B2 · kind B2 · utility

8Cited by
1References
10Claims
0Family size

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Inventor

Key dates

Filing dateDec 14, 2015
Grant dateApr 30, 2019
Priority date
Expiry dateDec 22, 2035

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH04R2201/003
  • WIPO fieldAudio-visual technology
  • WIPO sectorElectrical engineering

Abstract

The present invention discloses a manufacturing method of an integrated structure of a MEMS microphone and a pressure sensor, which comprises the following steps: depositing an insulating layer, a first polycrystalline silicon layer, a sacrificial layer and a second polycrystalline silicon layer in sequence on a shared substrate; etching the second polycrystalline silicon layer to form a vibrating diaphragm and an upper electrode; eroding the sacrificial layer to form a containing cavity of a microphone and a pressure sensor, and etching the sacrificial layer between the microphone and the pressure sensor; etching the first polycrystalline silicon layer to form a back electrode of the microphone and a lower electrode of the pressure sensor; etching a position of the shared substrate below a back electrode of the microphone to form a back cavity; and etching away the region of the insulating layer below the back electrode. A capacitance structure of a MEMS microphone and that of a pressure sensor are integrated on a shared substrate, improving integration of a MEMS microphone and a pressure sensor, and greatly reducing a size of a whole packaging structure; in addition, a microphone…

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.