Semiconductor device and method of manufacturing the same
US10283709B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 28, 2017 |
| Grant date | May 7, 2019 |
| Priority date | — |
| Expiry date | Nov 28, 2037 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10N70/8836
Abstract
In an embodiment, a substrate that includes a cell region and a dummy region is provided. Lower interconnection structures are formed in the cell region and the dummy region. One or more first multilayered structure patterns are formed in the cell region and one or more second multilayered structure patterns in the dummy region over the lower interconnection structures. The first multilayered structure patterns and second multilayered structure patterns extend in a first direction. Each of the second multilayered structure patterns includes an etch target layer. An insulating material layer is formed over the first multilayered structure patterns and the second multilayered structure patterns. An interlayer insulating layer that fills a space between two adjacent patterns of the first multilayered structure patterns and second multilayered structure patterns is formed by planarizing the insulating material layer. The etch target layer in each of the second multilayered structure patterns is removed.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.